Digital circuit testing and testability
Material type:![Text](/opac-tmpl/lib/famfamfam/BK.png)
- 0-12-434330-9
- TK 7874 75 L35
Item type | Current library | Collection | Call number | Copy number | Status | Date due | Barcode |
---|---|---|---|---|---|---|---|
Préstamo | Biblioteca Pedro Arrupe | Acervo | TK 7874 75 L35 (Browse shelf(Opens below)) | Ej. 1 | Available | 042973 |
Browsing Biblioteca Pedro Arrupe shelves, Collection: Acervo Close shelf browser (Hides shelf browser)
TK 7874 65 D4 Synthesis and optimization of digital circuits | TK 7874 65 W34 2000 Digital design : principles and practices | TK 7874 65 W34 2001 Digital design : principles and practices | TK 7874 75 L35 Digital circuit testing and testability | TK 7874 8 E44 2005 Emerging nanoelectronics : life with and after CMOS / | TK 7874 8 E44 2005 Emerging nanoelectronics : life with and after CMOS / | TK 7874 8 E44 2005 Emerging nanoelectronics : life with and after CMOS / |
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