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Digital circuit testing and testability

Lala, Parag K.

Digital circuit testing and testability - Estados Unidos : Academic Press, 1997 - 199 p. ; 24 cm.

ISBN: 0-12-434330-9

Subjects--Topical Terms:
Circuitos integrados ---Gran escala integrada ---Pruebas
Circuitos integrados digitales

LC Class. No.: TK 7874 / 75 L35

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