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Medición y prueba de semiconductores (diodos, transistores y tiristores) by
  • Orozco Mancilla, Javier
Series: Serie Guía rápida ; 3
Material type: Text Text; Format: print ; Literary form: Not fiction
Publication details: México : Radio-Gráfica
Availability: Items available for loan: Biblioteca Pedro Arrupe (1)Call number: TK 7871 85 O76. Not available: Biblioteca Pedro Arrupe: Estanteria cerrada (1).

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