000 | 01582cam a22003494a 4500 | ||
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001 | CIA01000000000000000073564 | ||
005 | 20220227193308.0 | ||
008 | 040212t20042004wiua bf 001 0 eng | ||
900 | _aBK | ||
010 | _a2004003464 | ||
020 | _a0873896203 | ||
040 |
_aDLC _cDLC _dDLC _dUIA P |
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050 | 4 |
_aT 50 _bM423 2004 |
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245 | 0 | 4 |
_aThe metrology handbook / _cThe Measurement Quality Division ; Jay Bucher, editor |
260 |
_aMilwaukee, Wisc. _bASQ Quality Press _cc2004 |
||
300 |
_axvi, 544 p. _bil. _c27 cm. _e1 CD-ROM (4 3/4 plg.) |
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504 | _aIncluye referencias bibliográficas e índice. | ||
505 | 0 |
_tBackground -- _tQuality Systems -- _tMetrology Concepts -- _tMathematics and Statistics: Their Use in Measurement -- _tUncertainty in Measurement -- _tMeasurement Parameters -- _tManaging a Metrology Department or Calibration Laboratory. |
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505 | 0 | _tIncluye material complementario: 1 CD-ROM (8.99 Mb), mismo título y clasificación. Disponible en colección MT. | |
650 | 4 | _aMetrología - | |
650 | 0 |
_aMediciones - _vManuales |
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650 | 4 |
_aCalibración - _vManuales |
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650 | 4 | _aAseguramiento de la calidad | |
700 | 1 |
_aBucher, Jay L. _d1949- |
|
710 | 2 |
_aAmerican Society for Quality _bMeasurement Quality Division. |
|
856 | 4 | 0 |
_zTable of contents _uhttp://www.loc.gov/catdir/toc/ecip0415/2004003464.html |
903 |
_aLUCERO _b20 _c20060324 _lCIA01 _h1237 |
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903 |
_aJUANJOSE _b30 _c20060420 _lCIA01 _h1903 |
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903 |
_aJUANJOSE _b30 _c20060420 _lCIA01 _h1905 |
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903 |
_aJUANJOSE _b30 _c20060420 _lCIA01 _h1907 |
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903 |
_c20141127 _lCIA01 _h2301 |
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999 |
_c160596 _d160596 |