Medición y prueba de semiconductores (diodos, transistores y tiristores)
Material type:
TextSeries: Serie Guía rápida ; 3Publication details: México : Radio-GráficaDescription: 43 p. : il. ; 13 cmSubject(s): LOC classification: - TK 7871 85 O76
| Item type | Current library | Collection | Call number | Copy number | Status | Date due | Barcode | |
|---|---|---|---|---|---|---|---|---|
| Préstamo | Biblioteca Pedro Arrupe | Acervo | TK 7871 85 O76 (Browse shelf(Opens below)) | Ej. 2 | Available | 044414 | ||
| Préstamo | Biblioteca Pedro Arrupe | Acervo | TK 7871 85 O76 (Browse shelf(Opens below)) | Ej. 3 | En proceso de descarte | 044658 |
There are no comments on this title.
Log in to your account to post a comment.