Medición y prueba de semiconductores (diodos, transistores y tiristores)
Material type:![Text](/opac-tmpl/lib/famfamfam/BK.png)
- TK 7871 85 O76
Item type | Current library | Collection | Call number | Copy number | Status | Date due | Barcode |
---|---|---|---|---|---|---|---|
Préstamo | Biblioteca Pedro Arrupe | Acervo | TK 7871 85 O76 (Browse shelf(Opens below)) | Ej. 2 | Available | 044414 | |
Préstamo | Biblioteca Pedro Arrupe | Acervo | TK 7871 85 O76 (Browse shelf(Opens below)) | Ej. 3 | Estanteria cerrada | 044658 |
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